Fischerscope X-Ray XDVM-W coating thickness gauge

The Fischerscope® X-Ray XDVM®-W can measure the coating thickness and alloy composition of virtually any metal coating system

The FISCHERSCOPE® X-RAY XDVM®-W can measure the coating thickness and alloy composition of virtually any metal coating system, including single, binary, and ternary alloy coatings, double coatings, double coatings with one alloy layer, and triple coatings.

The XDVM-W is ideally suited for high volume coating thickness measurements on screws, connector contacts, contact strips, PC boards. The system measures according to test method ASTM B568 or DIN 50987 and ISO 3497 respectively.

The FISCHERSCOPE XDVM-W features a solid sheet metal housing for the measuring chamber and convenient access to the large slotted measuring chamber (560 mm X 530 mm X 160 mm/ 22" X 20.9" X 6.3") that is suitable for both very small and very large specimens. High precision, fast, programmable XY measuring stages have travel distances of 175 mm X 175 mm (6.9" X 6.9") and 250 mm X 250 mm (9.8" X – 9.8"). The measuring head is programmable in the Z-axis, with a travel distance of 145-mm (5.7"). Fast travel to XYZ coordinates is accomplished with the click of a mouse.

Users can select between two collimator assemblies, each with four apertures. Simple yet precise sample positioning is accomplished using a high-resolution color video camera that includes switchable magnification and inserted cross hair true-to-scale test spot display, particularly important for measurements on very small structures. The XDVM-W includes a micro-focus, high-performance X-ray tube, Ni and Be primary filters, Xenon filled proportional counter tube with internal 4096 channel ADC spectrum processing with compression to 256 channels for external display, and four focal planes for measuring close to steps and in recesses with a height difference of up to 90 mm.

The new XDVM-W features Fischer's powerful new WinFTM® software that runs under Windows™ 95/98 and Windows™ NT. WinFTM provides high precision.

measurement based on a unique analysis of the fluorescence spectrum through the simple and versatile FP (fundamental parameter) method, more accurate and effective than the peak deconvolution technique. All physical properties relative to the X-ray fluorescence method are computer simulated, eliminating the need for calibration standards. The only input necessary from the user is the number of layers and elements present in the coating, as well as a definition of the substrate material. The software can handle even extremely difficult applications, including triple coatings, even if the same element occurs more than once.

Full statistical and SPC functions are included in WinFTM with computation for all statistical parameters. A print form template editor module allows set up of customer-specific formats with the ability to integrate the video image of the specimen or any other BMP file, saved as a Microsoft Word document.